thin film characterization

Angstrom Sun Technologies Inc., headquartered in Boston, USA, is a privately held company specializing in affordable optical solutions. It provides cost-effective tools for characterizing thin film thickness, thick coating thickness, wafer thickness, gap thickness, optical properties (refractive index N and extinction coefficient K), surface and interface behavior, and alloy concentrations. It also offers advanced analytical services for thin films, thick coatings, complex layer stacks, wafer thickness, TTV, and gap thickness, plus vision products with U

Analytical and development services for thin filmsAutomation with wafer mappingFilm thickness mappingIn-line and in-situ metrologyMicrospectrophotometryspectroscopic ellipsometrySpectroscopic reflectometryWafer thickness measurement

Eclipse Energy Systems, Inc. combines scientific and engineering expertise to provide solutions for terrestrial and space-based challenges. Its main laboratory is a 10,500 square foot nanotechnology facility with thin film modeling, vacuum deposition areas, test and characterization, wet and polymer processing, and a machine shop for rapid prototyping. The company designs, prototypes and manufactures custom thin film coatings.

electrochromic film fabricationfilter design and fabricationmachiningrapid prototypingroll to roll coatingthin film modelingvacuum depositionwet and polymer processing

J.A. Woollam designs and manufactures spectroscopic ellipsometers for thin film characterization, including the M-2000, RC2, iSE, theta-SE, alpha 2.0, VASE, IR-VASE, and VUV-VASE systems, along with WVASE and CompleteEASE software. The company is headquartered in Lincoln, Nebraska, and serves applications in optical coatings, chemistry/biology, semiconductors, photovoltaics, and in-situ process monitoring.

automated mappinggeneralized ellipsometryin-situ monitoring and process controlMueller-matrix measurementspectroscopic ellipsometry