low energy ion scattering (LEIS)

IONTOF USA is the US-based subsidiary of IONTOF, a German manufacturer of instruments for surface analysis with product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). IONTOF was founded in 1989 as a spin-off of the University of Münster. IONTOF USA was founded in 2000 to represent IONTOF and its product lines in the United States and provide support to TOF-SIMS and LEIS customers, operating a full service network with trained service engineers across the United States.

Read more

3D analysisdepth profilingin situ SPMion beam technologyMS/MSretrospective analysissurface analysissurface imagingtime-of-flight secondary ion mass spectrometry (TOF-SIMS)